JESD47H Stress-Test-Driven Qualification of Integrated Circuits.pdf 可靠性文档 可靠性资料 11年3月22日 编辑 namixiaoxin 取消关注 关注 私信 集成电路可靠性试验常使用的标准 给TA打赏 共{{data.count}}人 人已打赏
adminM可靠性网管理员 黄金会员lv6lv6 11年3月23日 谢谢楼主分享.摘录部分内容: Thisstandarddescribesabaselinesetofacceptancetestsforuseinqualifyingelectroniccomponentsasnewproducts,aproductfamily,orasproductsinaprocesswhichisbeingchanged. Thesetestsarecapableofstimulatingandprecipitatingsemiconductordeviceandpackagingfailures. Theobjectiveistoprecipitatefailuresinanacceleratedmannercomparedtouseconditions.FailureRateprojectionsusuallyrequirelargersamplesizesthanarecalledoutinqualificationtesting.Forguidanceonprojectingfailurerates,refertoJESD85MethodsforCalculatingFailureRatesinUnitsofFITs.Thisqualificationstandardisnotaimedatextremeuseconditionssuchasmilitaryapplications,automotiveunder-the-hoodapplications,oruncontrolledavionicsenvironments,nordoesitaddress2ndlevel reliabilityconsiderations,whichareaddressedinJEP150
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感谢分享，学习ing
学习。。。现在遇到一个IC将金线换成铜线的评估
学习一下
谢谢楼主
谢谢楼主分享.摘录部分内容:
Thisstandarddescribesabaselinesetofacceptancetestsforuseinqualifyingelectroniccomponentsasnewproducts,aproductfamily,orasproductsinaprocesswhichisbeingchanged.
Thesetestsarecapableofstimulatingandprecipitatingsemiconductordeviceandpackagingfailures.
Theobjectiveistoprecipitatefailuresinanacceleratedmannercomparedtouseconditions.FailureRateprojectionsusuallyrequirelargersamplesizesthanarecalledoutinqualificationtesting.Forguidanceonprojectingfailurerates,refertoJESD85MethodsforCalculatingFailureRatesinUnitsofFITs.Thisqualificationstandardisnotaimedatextremeuseconditionssuchasmilitaryapplications,automotiveunder-the-hoodapplications,oruncontrolledavionicsenvironments,nordoesitaddress2ndlevel
reliabilityconsiderations,whichareaddressedinJEP150