[quote][url=pid=190483&ptid=15869]stevelyang 发表于 2017-9-22 03:44[/url]
HTOL is applied to assess the quality and reliability for the devices, In general, it is a accelerat …[/quote]
HTOL is applied to assess the quality and reliability for the devices, In general, it is a accelerated testing.
It can be used to predict the life time at critical failure rate level ( if a acceleration model is available).
[quote][url=pid=190483&ptid=15869]stevelyang 发表于 2017-9-22 03:44[/url]
HTOL is applied to assess the quality and reliability for the devices, In general, it is a accelerat …[/quote]
請問HTOL 是正常最大操作電壓去做125度(也是可以使用工作範圍溫度), 這樣做1000HR也算是加速實驗嗎??
HTOL is applied to assess the quality and reliability for the devices, In general, it is a accelerated testing.
It can be used to predict the life time at critical failure rate level ( if a acceleration model is available).
好东西,:lol
好东西,:lol
关于htol的标准是什么呢?
你提到的这几个试验都是寿命试验,不是筛选器件的早期失效。
筛选早期失效多用于IC,比如存储器等。
不同的应力条件对应不同的加速模型,最后计算出来的寿命有一定的参考价值,但不等效于寿命。
主要是针对不同失效机理的加速试验,对使用寿命的评估,所以时间上比较长。
筛选器件的早期失效的试验,且一般测试时间不会太长。
有人吗?