请教关于MTBF的问题 可靠性技术 可靠性试验 08年8月8日 编辑 wolf9512 取消关注 关注 私信 我想通过实验计算某电子产品的MTBF值,请问需要进行什么实验?实验应遵循哪些标准?请各位高手帮忙回答,或推荐一些资料,小弟刚接触可靠性,很多不懂,谢谢!!:P 给TA打赏 共{{data.count}}人 人已打赏
yeh lv6lv6 08年8月31日 ReliabilityDemonstrationMethods Whendemonstratingthereliabilityofaproduct,theexactfailuretimecanneverbeknow.Notwithstandingthisfact,wearerequiredtohypothesizeregardingourconfidenceintheintegrityofournumbers.TheChi2distributionisoftenusedinthiscasebecauseitisaprobabilitydistributionthatrelatestheobservedtotheexpectedvalues. TherelationshipbetweenfailurerateandtheChi2distributionisasfollows: lamda=X^2(Alpha,Bate)/2*time*Af Where alpha=((100–CL)/100CL(ConfidenceLevel)=60%,90%. Bate=Degreesoffreedom=2*numberoffailures+2 Af=Accelerationfactor,asdeterminedbyoneofthemethodsdiscussedearlier Whenestimatingfailurerates,Vicorusesaccelerationfactorstodetermineusefailure ratesbasedonlabfailurerates. AcceleratedLifeTesting Theequationbelowisusedtomodelaccelerationduetotemperatureandisreferredtoas theArrheniusequation.TheArrheniusequationrelateshowincreasedtemperature acceleratestheageofaproductascomparedtoitsnormaloperatingtemperature. Af=e^{(Ea/k)*(1/Tu-1/Tt)} Af=accelerationfactor Ea=activationenergyinelectron-volts(eV) k=Boltzmann’sconstant(k=8.617×10-5eV/Tk) Tk=Kelvin Tu=referencejunctiontemperature,indegreesKelvin(K=C+273) Tt=junctiontemperatureduringtest,indegreesKelvin e=2.71828(baseofthenaturallogarithms) MTBF=1/lamda
reliability lv6lv6 08年8月11日 [quote]原帖由[i]苏州检测机构[/i]于2008-8-1114:21发表 这个问题很简单,我们是专门做检测的,需要资料的话给我电话或者邮件13771850837[email]wapp10000@126.com[/email][/quote] 我们不欢迎广告,只欢迎技术类的交流讨论。 如果楼上朋友觉得问题很简单,可以发表你的观点。
規范你可以參考MIL-HDBK-217或 Telcordia
規范你可以參考MIL-HDBK-217或 Telcordia
ReliabilityDemonstrationMethods
Whendemonstratingthereliabilityofaproduct,theexactfailuretimecanneverbeknow.Notwithstandingthisfact,wearerequiredtohypothesizeregardingourconfidenceintheintegrityofournumbers.TheChi2distributionisoftenusedinthiscasebecauseitisaprobabilitydistributionthatrelatestheobservedtotheexpectedvalues.
TherelationshipbetweenfailurerateandtheChi2distributionisasfollows:
lamda=X^2(Alpha,Bate)/2*time*Af
Where
alpha=((100–CL)/100CL(ConfidenceLevel)=60%,90%.
Bate=Degreesoffreedom=2*numberoffailures+2
Af=Accelerationfactor,asdeterminedbyoneofthemethodsdiscussedearlier
Whenestimatingfailurerates,Vicorusesaccelerationfactorstodetermineusefailure
ratesbasedonlabfailurerates.
AcceleratedLifeTesting
Theequationbelowisusedtomodelaccelerationduetotemperatureandisreferredtoas
theArrheniusequation.TheArrheniusequationrelateshowincreasedtemperature
acceleratestheageofaproductascomparedtoitsnormaloperatingtemperature.
Af=e^{(Ea/k)*(1/Tu-1/Tt)}
Af=accelerationfactor
Ea=activationenergyinelectron-volts(eV)
k=Boltzmann’sconstant(k=8.617×10-5eV/Tk)
Tk=Kelvin
Tu=referencejunctiontemperature,indegreesKelvin(K=C+273)
Tt=junctiontemperatureduringtest,indegreesKelvin
e=2.71828(baseofthenaturallogarithms)
MTBF=1/lamda
还是不太清楚,希望有高手细心解答,呵呵!
[quote]原帖由[i]苏州检测机构[/i]于2008-8-1114:21发表
这个问题很简单,我们是专门做检测的,需要资料的话给我电话或者邮件13771850837[email]wapp10000@126.com[/email][/quote]
我们不欢迎广告,只欢迎技术类的交流讨论。
如果楼上朋友觉得问题很简单,可以发表你的观点。
我们公司测试MTBF是在温度:40度,湿度:85%的环境下加温,根据该环境与用户使用环境的差异算出加速因子,在去算MTBF
規范你可以參考MIL-HDBK-217或 Telcordia