Performance range/性能参数

Temperature range of
the hot chamber from +50 °C to +220 °C

热箱温度范围

Temperature range of
the cold chamber from -80 °C to +70 °C
冷箱温度范围

Hot and cold chambers may also be utilized as individual
temperature chambers.
热箱和冷箱均可单独使用

Temperature deviation in time
in centre of working space ±0.3 K to ±1.0 K
工作空间中心点的温度波动

Temperature deviation in space ±1.0 K to ±2.0 K
试验空间的温度均匀度

Temperature gradient
according to IEC 60068-3-5 2 K to 4 K
符合IEC 60068-3-5的温度梯度

Wall distance of the
measuring points 100 mm
测量点距试验箱壁距离

Temperature Calibration values -40 °C cold chamber and +125 °C hot chamber

温度校准值冷箱-40 °C和热箱+125 °C

Hot chamber heating rate
according to IEC 60068-3-5,
(measured in the middle of test
space from+50 °C to +203 °C) 11.0 K/min
按照IEC 60068-3-5热箱升温速率

(测量在试验空间的中心点

从+50 °C 至 +203 °C )

Cold chamber cooling rate
according to IEC 60068-3-5,
(measured in the middle of test
space from +70 °C to -69 °C) 5.0 K/min
按照IEC 60068-3-5冷箱降温速率

(测量在试验空间的中心点

从+70 °C 至 -69 °C )

Cold chamber heating rate
according to IEC 60068-3-5,
(measured in the middle of test
space from -65 °C to +57 °C) 1.5 K/min
按照IEC 60068-3-5冷箱升温速率

(测量在试验空间的中心点

从-65 °C 至 +57 °C )

Temperature changing tests:
MIL 883 F, Method 1010.7,
Test condition F with 20 kg
of IC\\\’s distributed over
4 shelves Adaption time < 15 min, measurement on test specimens

温度变化试验：恢复时间< 15 min，在试验样品上测量

按MIL 883 F, Method 1010.7,
试验条件F，有12 kg的IC’s ，

均匀分散于4个样品架

The following standards

are met                                            DIN 40 046, page 14, test Na
满足标准                                          IEC 60068-2, sect. 14, test Na
                                                         MIL-STD-883 F, method 1010.7, test condition A, B, C, F

联系：富奇－华南区,13352829250,
香港官塘，华南区