不同品牌的同类产品如何通过可靠性试验（加速试验）来对比？ 可靠性技术 可靠性试验 09年6月9日 编辑 chenmanwen 取消关注 关注 私信 同样是电压监控芯片（一个是IMP809，一个是CAT809），封装都是SOT-23，怎么在短时间内判断出哪个更可靠？求助各位了，指条明路吧~~~:L:L:L 给TA打赏 共{{data.count}}人 人已打赏
chenmanwenA lv2lv2 09年6月10日 我要测试的芯片Specifiedoverfulltemperaturerange：–40°Cto105°C，HTOL里说要达到125°C，已经超出这种芯片的温度范围了。。。。还能长时间在老化炉里工作吗？？
chenmanwenA lv2lv2 09年6月10日 HTOListypicallyusedwhenanICispresentthatrequiresmorethanonejunctionorgatetobebiasedfortheoperationofthedevice.Thetemperatureandvoltageconditionsusedinthestresswillvarywiththeproductbeingstressed.However,thetypicalstressambientis150degCwiththebiasappliedequalto80%ofratedvoltagefordiscretedevices.ForIC’s,thegoalistomaintainajunctiontemperatureof125degCor150degC.Testiscontinuouslybiasedbetweenmeasurementintervals.Normalmeasurementintervalsare0hours,504hours(3weeks)and1008hours(6weeks). TheHighTemperatureOperatingLife(HTOL)orsteady-statelifetestisperformedtodeterminethereliabilityofdevicesunderoperationathightemperatureconditionsoveranextendedperiodoftime.Itconsistsofsubjectingthepartstoaspecifiedbiasorelectricalstressing,foraspecifiedamountoftime,andataspecifiedhightemperature(essentiallyjustalong-termburn-in). Unlikeproductionburn-inwhichacceleratesearlylifefailures,HTOLtestingisappliedtoassessthepotentialoperatinglifetimesofthesamplepopulation(hencetheterm’lifetest’).Itisthereforemoreconcernedwithaccelerationofwear-outfailures.Assuch,lifetestsshouldhavesufficientdurationstoassurethattheresultsarenotduetoearlylifefailuresorinfantmortality. ThetestdurationmaybedecreasedbyincreasingtheambienttemperatureforconditionsAtoE(refertoTableI,Method1005).Unlessotherwisespecified,allintermediateandend-pointelectricaltestsmustbeperformedonthepartswithin96hours(24hoursforTa>=175degC)aftertheirremovalfromthespecifiedburn-inconditions.Ifnotspecified,anintermediateelectricaltestingshallbeperformedafter168(+72,-0)hoursandafter504(+168,-0)hoursSinceHTOLissimplylong-termburn-in,itisaccomplishedbyutilizinganyburn-inovencapableofoperatingcontinuouslyoverlongdurations. FailuremechanismsacceleratedbyHTOLincludeTime-DependentDielectricBreakdown(TDDB),electromigration,hotcarriereffects,chargeeffects,mobileioniccontamination,etc. 引用: MilStd883,Method1005Specs: generally1000hoursmin.at125degC max.ratedTcorTa<200degC(ClassB) max.ratedTcorTa<175degC(ClassS) ConditionA:steady-state,reversebias ConditionB:steady-state,forwardbias ConditionC:steady-state,power/reversebias ConditionD:steady-state,parallelexcitation ConditionE:steady-state,ringoscillator ConditionF:steady-state,temp.-accelerated OtherHTOLConditions(dependingonuse): Ta=125C,1000H,maxPdis Ta=150C,500H,maxPdis 125C
chenmanwenA lv2lv2 09年6月10日 [quote]原帖由[i]yeh[/i]于2009-6-918:58发表[url=pid=50275&ptid=6336][/url] MIN77pcs[/quote] 为什么最少需要77片？
yeh lv6lv6 09年6月9日 [quote]原帖由[i]chenmanwen[/i]于2009-6-917:38发表[url=pid=50263&ptid=6336][/url] 这个芯片的工作和电压有关，那电压输入需要变化吗？[/quote] 原则上不做电压调变 实施电压加速时则提高试验电压
yeh lv6lv6 09年6月9日 [quote]原帖由[i]sunjj[/i]于2009-6-917:11发表[url=pid=50249&ptid=6336][/url] 使用高温操作寿命(HTOL)试验.[/quote] MIN77pcs
好资料，谢谢分享，长见识了
芯片StorageTemperatureRange：–65°Cto160°C
是不是说就不通电，放在125°C的环境里100h??
有没有人能解释一下啊:'(:'(:'(
我要测试的芯片Specifiedoverfulltemperaturerange：–40°Cto105°C，HTOL里说要达到125°C，已经超出这种芯片的温度范围了。。。。还能长时间在老化炉里工作吗？？
HTOListypicallyusedwhenanICispresentthatrequiresmorethanonejunctionorgatetobebiasedfortheoperationofthedevice.Thetemperatureandvoltageconditionsusedinthestresswillvarywiththeproductbeingstressed.However,thetypicalstressambientis150degCwiththebiasappliedequalto80%ofratedvoltagefordiscretedevices.ForIC’s,thegoalistomaintainajunctiontemperatureof125degCor150degC.Testiscontinuouslybiasedbetweenmeasurementintervals.Normalmeasurementintervalsare0hours,504hours(3weeks)and1008hours(6weeks).
TheHighTemperatureOperatingLife(HTOL)orsteady-statelifetestisperformedtodeterminethereliabilityofdevicesunderoperationathightemperatureconditionsoveranextendedperiodoftime.Itconsistsofsubjectingthepartstoaspecifiedbiasorelectricalstressing,foraspecifiedamountoftime,andataspecifiedhightemperature(essentiallyjustalong-termburn-in).
Unlikeproductionburn-inwhichacceleratesearlylifefailures,HTOLtestingisappliedtoassessthepotentialoperatinglifetimesofthesamplepopulation(hencetheterm’lifetest’).Itisthereforemoreconcernedwithaccelerationofwear-outfailures.Assuch,lifetestsshouldhavesufficientdurationstoassurethattheresultsarenotduetoearlylifefailuresorinfantmortality.
ThetestdurationmaybedecreasedbyincreasingtheambienttemperatureforconditionsAtoE(refertoTableI,Method1005).Unlessotherwisespecified,allintermediateandend-pointelectricaltestsmustbeperformedonthepartswithin96hours(24hoursforTa>=175degC)aftertheirremovalfromthespecifiedburn-inconditions.Ifnotspecified,anintermediateelectricaltestingshallbeperformedafter168(+72,-0)hoursandafter504(+168,-0)hoursSinceHTOLissimplylong-termburn-in,itisaccomplishedbyutilizinganyburn-inovencapableofoperatingcontinuouslyoverlongdurations.
FailuremechanismsacceleratedbyHTOLincludeTime-DependentDielectricBreakdown(TDDB),electromigration,hotcarriereffects,chargeeffects,mobileioniccontamination,etc.
引用:
MilStd883,Method1005Specs:
generally1000hoursmin.at125degC
max.ratedTcorTa<200degC(ClassB)
max.ratedTcorTa<175degC(ClassS)
ConditionA:steady-state,reversebias
ConditionB:steady-state,forwardbias
ConditionC:steady-state,power/reversebias
ConditionD:steady-state,parallelexcitation
ConditionE:steady-state,ringoscillator
ConditionF:steady-state,temp.-accelerated
OtherHTOLConditions(dependingonuse):
Ta=125C,1000H,maxPdis
Ta=150C,500H,maxPdis
125C
[quote]原帖由[i]yeh[/i]于2009-6-918:58发表[url=pid=50275&ptid=6336][/url]
MIN77pcs[/quote]
为什么最少需要77片？
[quote]原帖由[i]chenmanwen[/i]于2009-6-917:38发表[url=pid=50263&ptid=6336][/url]
这个芯片的工作和电压有关，那电压输入需要变化吗？[/quote]
原则上不做电压调变
实施电压加速时则提高试验电压
[quote]原帖由[i]sunjj[/i]于2009-6-917:11发表[url=pid=50249&ptid=6336][/url]
使用高温操作寿命(HTOL)试验.[/quote]
MIN77pcs
这个芯片的工作和电压有关，那电压输入需要变化吗？
HTOL？样本量有讲究吗？
使用高温操作寿命(HTOL)试验.