JESD78 IC latch-up_test.pdf

如题，目录如下：

1Scope1
1.1Purpose1
1.2Classification1
1.3Level1
2Definitions
2.1Cool-downtime1
2.2DUT2
2.3GND(Ground)2
2.4Inputpins2
2.5I/O(Bi-directional)pins2
2.62.7IsupplyI-test22
2.8Latch-up2
2.9Logic-high3
2.10Logic-low3
2.11MaximumVsupply3
2.12“NoConnect”pin3
2.13NominalIsupply(Inom)3
2.14Outputpin4
2.15Preconditionedpin4
2.16Testingofdynamicdevices4
2.17Testcondition4
2.18Timingrelatedinputpin4
2.19TriggerPulse4
2.20Triggerduration4
2.21Vsupplypin(orpingroup)4
2.22Vsupplyovervoltagetest5
3ApparatusandMaterial5
3.1Latch-uptester5
3.2Automatedtestequipment(ATE)5
3.3HeatSource5

[[i]本帖最后由cliffcrag于2007-12-1111:55编辑[/i]]