Reliabilitygrowthtestinginvolvestheselectionofoptimaldesignparameterstoenhanceaproduct’sreliability.This paperproposesasplitplotexperimentaldesignthataccommodatestherestrictiononrandomizationontheorderofexperimentalrunscausedbytheexperimentalnatureofacceleratedreliabilitytesting.Theproposedexperimental designprovidesstatisticallyrelevantsolutionsaboutthechoiceofdesignparameters,intermsoftheirreliabilityimpact, inamuchshortertime.Adegradationmodelthataidsinpredictingthefailuretimeforthegivenproblemfurther supplementsthisdiscussion.
Reliability enhancement of electronic packages
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