Recommended methods for predicting device and unit hardware reliability. These techniques estimate the mean failure rate in
FITs for electronic equipment. This procedure also documents a recommended method for predicting serial system hardware
reliability.
Tables needed to facilitate the calculation of reliability predictions.
Revised generic device failure rates in Section 8, based mainly on new data for many components.
An extended range of complexity for devices, and the addition of new devices.
Revised environmental factors in Section 9 based on field data and experience.
Clarification and guidance on items raised by forum participants and by frequently asked questions from users.
Also Available!!! An Updated Version of the Reliability Software Tool that Automates the Reliability Prediction Techniques in
SR-332
路过
路过 so expensive 感谢:lol too expensive. too too expensive.
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