看来是个好资料,DOWN下来慢慢学习一下。先多谢楼主了,下面帮忙摘要出DemonstrationTestMethod(DTM)文章的一些信息来。
Abstract:Revision1oftheDemonstrationTestMethod(DTM)incorporatestheexperienceofdeployingthe
DTMinmultipletestsandreflectsthechangingrequirementsfor1998and180nmprocesses.The
International300mmInitiative(I300I)DTMisaguidelineforcharacterizingprocessperformance
andreliabilityofsemiconductorICprocessandmetrologyequipmentatanydevelopmentmaturity.
Itprovidesamethodforexperimentationscaledtothematurityofthetoolorprocessbeingtested.
TheDTMiscomposedofthreestages:determinethematurityofthetoolorprocesstobetested,
selectandexecutetheappropriatetesting,andreportthetestresultsinastandardizedformat.
Keywords:Equipment,TestMethods,ReliabilityTesting
Authors:SteveFultonandDavidCarswell
Approvals:SteveFulton,Author/ReliabilityProgramManager
RandyGoodall,AssociateDirectorofProductivityandInfrastructure
AshwinGhatalia,DirectorofProductivityandInfrastructure
LaurieModrey,TechnicalInformationTransferTeamLeader |