1.0INTRODUCTION
Thepurposeofthisdocumentistoprovideempiricalfieldfailureratedataonelectronic
components.ThecomponenttypesforwhichdataispresentedinthisdocumentareCapacitors,
Diodes,IntegratedCircuits,OptoelectronicDevices,Resistors,Thryistors,Transformers,andTransistors.Reliabilitydataisrequiredtoperformreliabilityassessmentsofsystems.Theparttypesforwhichdataiscontainedinthisdocumentarethosecontainedinexistingreliabilitypredictionmethodologies,suchasMIL-HDBK-217.WhereasMIL-HDBK-217containsmathematicalmodelsthathavebeenderivedfromempiricalfieldfailureratedata,thedatacontainedhereinishistoricallyobservedfieldfailurerates.Thisdatacanbeusedasanalternativetoexistingpredictionmethodologies.
Commercialqualitycomponentsarebecomingwidelyusedinmanyapplications,including
militarysystems.Muchofthedatacontainedinthisdocumentrelatestocommercialquality
components.Itcan,therefore,beusedtopredictreliabilityforbothcommercialandmilitary
systemscontainingcommercialqualitycomponents.
Thisdocument,alongwiththeRAC’sdocument“NonelectronicPartsReliabilityData,”(NPRD-95),containsall(non-proprietary)componentdatathatisintheRACdatabases.Thesetwodocumentsarecomplementaryandthereisnoduplicationofdatabetweenthem.Togethertheyprovidethecapabilityofestimatingthereliabilityofmostcomponenttypesusedinelectronicormechanicalsystems. |