namixiaoxin 发表于 2011-3-22 23:31:53

JESD47H Stress-Test-Driven Qualification of Integrated Circuits.pdf

集成电路可靠性试验常使用的标准

admin 发表于 2011-3-23 08:45:05

谢谢楼主分享.摘录部分内容:

Thisstandarddescribesabaselinesetofacceptancetestsforuseinqualifyingelectroniccomponentsasnewproducts,aproductfamily,orasproductsinaprocesswhichisbeingchanged.
Thesetestsarecapableofstimulatingandprecipitatingsemiconductordeviceandpackagingfailures.
Theobjectiveistoprecipitatefailuresinanacceleratedmannercomparedtouseconditions.FailureRateprojectionsusuallyrequirelargersamplesizesthanarecalledoutinqualificationtesting.Forguidanceonprojectingfailurerates,refertoJESD85MethodsforCalculatingFailureRatesinUnitsofFITs.Thisqualificationstandardisnotaimedatextremeuseconditionssuchasmilitaryapplications,automotiveunder-the-hoodapplications,oruncontrolledavionicsenvironments,nordoesitaddress2ndlevel
reliabilityconsiderations,whichareaddressedinJEP150

isablewawa 发表于 2011-6-10 13:32:36

学习一下
谢谢楼主

victor-he 发表于 2011-8-19 19:29:28

学习。。。现在遇到一个IC将金线换成铜线的评估

justqyou 发表于 2013-8-30 16:45:20

感谢分享，学习ing

长空皓_yUOc1 发表于 2020-5-27 16:32:06

学习了！！！！

jacktasi2000 发表于 2020-9-16 16:21:52

正需要, 雖然現在已經進版至K版

robin67 发表于 2020-10-24 12:42:46

有谁能分享下K版吗！
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