DDF13_Keven 发表于 2012-11-14 22:22:26

Semiconductor Reliability

供应商上课的讲义，和大家分享！

SemiconductorReliability

IntroductiontoReliabilityMethodology

InfantmortalityreductionforMOSFET

RandomFailureRatePredictionMethod

TemperatureAcceleration

Arrheniusmodel:
Example:
1000hourhightemperaturelifetestat150°Cisequivalenttohowmanyhoursofoperatinglifeat55°C.Assumingtheactivationenergyis0.7ev
AF=EXP{(0.7/8.617x10-5)x}=260
Sothetotalequivalentoperatingtimeis260,000hror27.6year
ForEa=1.0evAF=2825

ActivationEnergyvs.FailureMechanism

Note:Forhightemperatureoperatinglifetestwithunknownormultiplefailuremechanismusuallyaverageactivationenergy
of0.7evisusedforsemiconductorindustry.ThisisalsoallowedbyJEDECstandard

WearOutRegion(WaferProcessReliability)

PeckModel:Temperature&HumidityAcceleration

ExampleforManson-Coffin’sModel

AccelerationFactorAF={(TH-TL)/(Th-Ta)}M
ExampleforManson-Coffin’sModel
Example:30temperaturecycleforadevicefrom-65ºCto150ºCisequivalenttohowmanyyearsofoperationinacomputerenvironmenthavingjunctiontemperatureof55ºC.Assumingthecomputerturnonandoff3timesaday.(Troom=25ºC)
AF={(150+65)/(55-25)}6(formostofthepackagefailureM~6)=135489
EquivalentYear=30X135489/3/365=3712Yr
ForTj=85ºCAF=2117
EquivalentYear=30X2117/3/365=58Yr

yeh 发表于 2012-11-15 08:03:53

Failurerateunit:
1FIT=onefailureperonebilliondevicehours
=1PPMper1000devicehour
=10-91/hr

zlh95222 发表于 2012-11-15 08:32:59

我也看看，谢谢楼主的资料！

admin 发表于 2012-11-15 09:14:57

不错的资料，几个加速模型的例子，大家可以参考一下。

tmjgytgsw 发表于 2012-11-15 14:55:16

shared!TKS

ciomp_achilles 发表于 2012-11-15 19:57:05

good

DDF13_Keven 发表于 2012-11-15 20:13:04

IC公司都有这种讲义,但有些出于保密,不能和大家分享!!!

wangsheng16 发表于 2015-6-30 16:49:59

感谢分享!~

lohas 发表于 2016-10-31 17:14:18

good

mittermeyer 发表于 2016-11-1 15:15:48

感谢分享
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