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发表于 2007-12-7 09:52:24
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Quality and Reliability-SONY SEMICONDUCTOR
SUNJJ的资料,下载下来要加上RAR的后缀名哦,摘录一下目录出来!
CHAPTER1-QUALITYASSURANCEFORSEMICONDUCTORDEVICES
1.1ApproachtowardQualityAssurance..........................................................10
1.2QualityAssuranceSystemforSemiconductorDevices............................16
1.3ProductShippingQualityAssurance..........................................................26
1.4ProductLiability(PL)Act..............................................................................29
CHAPTER2-FAILUREMECHANISMS
2.1FailureModesandMechanisms.................................................................34
2.2FailureMechanismsRootedinDesignandtheWaferProcess................34
2.3FailureMechanismsRootedintheAssemblyProcess..............................52
2.4FailureMechanismsRootedintheMountingProcessandOccurringintheField.....59
CHAPTER3-FAILUREANALYSIS
3.1WhatisFailureAnalysis?.............................................................................98
3.2NecessityofFailureAnalysis.......................................................................99
3.3FailureAnalysis.............................................................................................99
CHAPTER4-RELIABILITYTESTSANDRELIABILITYPREDICTION
4.1ApproachTowardReliability......................................................................120
4.2WhatareReliabilityTests...........................................................................121
4.3AcceleratedLifeTests................................................................................127
4.4ReliabilityEvaluationbyTEG....................................................................130
4.5ReliabilityPrediction...................................................................................136
4.6TestCoverage.............................................................................................151
4.7ReliabilityRelatedStandards.....................................................................152
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Contents
CHAPTER5-NOTESONTHEUSEOFSEMICONDUCTORDEVICES
5.1EvaluationandAssuranceofSolderingHeatResistance.....................164
5.2NotesonHandlingforElectricBreakdown............................................179
5.3NotesonHandlingforMechanicalBreakdown.....................................191
5.4NotesonHandlingtoPreventThermalBreakdown..............................197
5.5NotesonHandlingtoPreventMisoperation..........................................203
5.6NotesonProductSpecifications,Packing,TransportandStorage......205
Appendix
1LotandProductNameIndications..........................................................218
2SamplingInspections...............................................................................223
3SaturatedVaporPressureTable..............................................................228
4BasicReliabilityTheory............................................................................232
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