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发表于 2018-1-24 12:45:19
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HTRB, high temperature reverse bias, 参考标准: JESD22-A108
4.2.3.3 High temperature reverse bias (HTRB)
The HTRB test is configured to reverse bias major power handling junctions of the device
samples. The devices are characteristically operated in a static operating mode at, or near,
maximum-rated breakdown voltage and/or current levels. The particular bias conditions should
be determined to bias the maximum number of the solid state junctions in the device. The
HTRB test is typically applied on power devices.
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