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发表于 2008-12-18 15:53:21
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IC的可靠性测试,建议如下项目.你可以根据你怀疑的失效机理来选择:
Bake
MoistureSoak
HighTemperatureOperatingLife----JESD-A108C
LowTemperatureOperatingLife
ThermalCycle----883F1010.7
ThermalShock----883F1011.9
THB----JESD22-A101orMIL-STD-8831003
HAST----JESD22-A110
PressureCookerTest----JESD22-A102C
LowTemperatureStorage
HighTemperautureStorage----JESD22-A103
Flammability----UL94
Leakage----883ForJESD22-A109
SaltAtmosphere----JESD22-A107B
Latch-up
ESD |
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