AEC对集成电路的应力测试标准

segn

以前曾经在IC行业做过一段时间的质量。虽然现在已经完全脱离了这个行当。还是在电脑里找到一些以前的东西。仅供对
集成电路可靠性测试有兴趣的参考。
先传一个，其他带我慢慢整理电脑
AECQ100StressTestQualificationforIntegratedCircuits


STRESSTESTQUALIFICATIONFORPACKAGEDINTEGRATEDCIRCUITS
Textenhancementsanddifferencesmadesincethelastrevisionofthisdocumentareshownasunderlinedareas.Severalfiguresandtableshavealsobeenrevised,butchangestotheseareashavenotbeenunderlined.

1.SCOPE
Thisdocumentcontainsasetofstresstestsanddefinestheminimumstresstestdrivenqualificationrequirementsandreferencestestconditionsforqualificationofintegratedcircuits(ICs).UseofthisdocumentdoesnotrelievetheICsupplieroftheirresponsibilitytomeettheirowncompany'sinternalqualificationprogram.Inthisdocument,"user"isdefinedasallcustomersusingadevicequalifiedperthisspecification.Theuserisresponsibletoconfirmandvalidateallqualificationdatathatsubstantiatesconformancetothisdocument.Supplierusageofthedevicetemperaturegradesasstatedinthis
specificationintheirpartinformationisstronglyencouraged.

1.1Purpose
Thepurposeofthisspecificationistodeterminethatadeviceiscapableofpassingthespecifiedstresstestsandthuscanbeexpectedtogiveacertainlevelofquality/reliabilityintheapplication.
1.2ReferenceDocuments
Currentrevisionofthereferenceddocumentswillbeineffectatthedateofagreementtothequalificationplan.Subsequentqualificationplanswillautomaticallyuseupdatedrevisionsofthesereferenceddocuments.
1.2.1Military
MIL-STD-883TestMethodsandProceduresforMicroelectronics
1.2.2Industrial
JEDECJESD-22ReliabilityTestMethodsforPackagedDevices
EIA/JESD78ICLatch-UpTest
UL-STD-94TestsforFlammabilityofPlasticmaterialsforpartsinDevicesandAppliances
J-STD-020Moisture/ReflowSensitivityClassificationforPlasticIntegratedCircuitSurfaceMountDevices

sunjj

AECQ100StressTestQualificationforIntegratedCircuits
是AEC（国际汽车电子委员会AutomotiveElectronicsCouncil）而非IEC；
是应力测试（StressTest）而非压力。

yeh

AEC-Q100-001:WIREBONDSHEARTEST
AEC-Q100-002:HUMANBODYMODEL(HBM)ELECTROSTATICDISCHARGE(ESD)TEST
AEC-Q100-003:MACHINEMODEL(MM)ELECTROSTATICDISCHARGE(ESD)TEST
AEC-Q100-004:ICLATCH-UPTEST
AEC-Q100-005:NONVOLATILEMEMORYWRITE/ERASEENDURANCE,DATARETENTION,ANDOPERATIONALLIFETEST
AEC-Q100-006:ELECTRO-THERMALLYINDUCEDPARASITICGATELEAKAGE(GL)TEST
AEC-Q100-007:FAULTSIMULATIONANDTESTGRADING
AEC-Q100-008:EARLYLIFEFAILURERATE(ELFR)
AEC-Q100-009:ELECTRICALDISTRIBUTIONASSESSMENT
AEC-Q100-010:SOLDERBALLSHEARTEST
AEC-Q100-011:CHARGEDDEVICEMODEL(CDM)ELECTROSTATICDISCHARGE(ESD)TEST

admin

感谢@sunjj@yeh兄的补充和修正。

我已帮楼主修改了标题的错误，AEC应力测试。