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发表于 2007-8-1 09:18:13
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多谢楼上朋友的分享。。
站务公告区主要是讨论站内事务,意见的版块,该贴将被移到可靠性试验版块去。
上传附件的时候,尽可能摘要一下附件的部份内容,以方便大家下载。谢谢。
下面是附件的部份内空摘要:
1.0INTRODUCTION
1.1Purpose
Thisdocumentistheworldwidetestandreliabilitystandardusedtospecifyacceleratedstresstesting(AST)ofelectricalandelectronicproducts.
1.2Overview
Backgroundinformation,methodology,responsibilities,anddetailedproceduresforASTarecontainedinthisdocument.ASTconsistsofhighlyacceleratedlifetest(HALT),screenverification,proof-of-screen(POS),andhighlyacceleratedstressscreening(HASS).
1.3Definitions&Acronyms
AST=acceleratedstresstesting
HALT=highlyacceleratedlifetest
HASS=highlyacceleratedstressscreening
POS=proof-of-screen
UOTL=upperoperatingtemperaturelimit
LOTL=loweroperatingtemperaturelimit
UDTL=upperdestructiontemperaturelimit
LDTL=lowerdestructiontemperaturelimit
OVL=operatingvibrationlimit
DVL=destructionvibrationlimit
2.0BACKGROUND
2.1Purpose
ThepurposeofASTistoprecipitateanddetect(observe)defectsinproductsduringdesignanddetectdefectsduringmanufacturing.Relevantdefects,orthoselikelytooccurindeployment,musthavetherootcauseidentifiedandtheoptimalsolutionmustbedetermined,implemented,andverified.Section4.3containsmoreinformationonrelevantdefects.
2.2Methodology
DuringAST,appliedstresseswillbeincreasedaboveexpecteddeploymentlevelstocompensateforarelativelysmallsamplesizeandtofinddefectsquickly.ASTsimulatesthedecreaseinproductstrengthovertime(cumulativefatiguedamage)oranabsoluteoverstresscondition.ASTusesa“test-to-failure”methodologyduringproductdesignanda“screening”processduringmanufacturing.Thesearedefinedinmoredetailinsections4to6ofthisdocument.
Theacceleratedstresstestmethodsforelectronicsandelectricalproductsinclude:
1.HALT(orproductruggedization)
2.ScreenverificationandPOS(preparationforHASS),
3.HASSThesemethodscanalsobeappliedtosomeelectromechanicalproducts. |
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